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Probabilistic models to assist maintenance of multiple instruments

The paper discusses maintenance challenges of organisations with a huge number of devices and proposes the use of probabilistic models to assist monitoring and maintenance planning. The proposal assumes connectivity of instruments to report relevant features for monitoring. Also, the existence of enough historical registers with diagnosed breakdowns is required to make probabilistic models reliable and useful for predictive maintenance strategies based on them. Regular Markov models based on estimated failure and repair rates are proposed to calculate the availability of the instruments and Dynamic Bayesian Networks are proposed to model cause-effect relationships to trigger predictive maintenance services based on the influence between observed features and previously documented diagnostics

© IEEE Conference on Emerging Technologies & Factory Automation : 2009 : ETFA 2009, 2009, p. 1-4

IEEE

Author: Meléndez i Frigola, Joaquim
López Ibáñez, Beatriz
Millán Ruiz, David
Date: 2009
Abstract: The paper discusses maintenance challenges of organisations with a huge number of devices and proposes the use of probabilistic models to assist monitoring and maintenance planning. The proposal assumes connectivity of instruments to report relevant features for monitoring. Also, the existence of enough historical registers with diagnosed breakdowns is required to make probabilistic models reliable and useful for predictive maintenance strategies based on them. Regular Markov models based on estimated failure and repair rates are proposed to calculate the availability of the instruments and Dynamic Bayesian Networks are proposed to model cause-effect relationships to trigger predictive maintenance services based on the influence between observed features and previously documented diagnostics
Format: application/pdf
Citation: Meléndez, J., López, B., i Millán-Ruiz, D. (2009). Probabilistic models to assist maintenance of multiple instruments. IEEE Conference on Emerging Technologies & Factory Automation : 2009 : ETFA 2009, 1-4. Recuperat 18 juny 2010, a http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5347263
ISBN: 978-1-4244-2727-7
ISSN: 1946-0759
Document access: http://hdl.handle.net/10256/2668
Language: eng
Publisher: IEEE
Collection: Reproducció digital del document publicat a: http://dx.doi.org/10.1109/ETFA.2009.5347263
Articles publicats (D-EEEiA)
Is part of: © IEEE Conference on Emerging Technologies & Factory Automation : 2009 : ETFA 2009, 2009, p. 1-4
Rights: Tots els drets reservats
Subject: Control predictiu
Estadística bayesiana
Markov, Processos de
Medicina -- Aparells i instruments
Bayesian statistical decision
Markov processes
Medical instruments and apparatus
Predictive control
Title: Probabilistic models to assist maintenance of multiple instruments
Type: info:eu-repo/semantics/article
Repository: DUGiDocs

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