Ítem
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Meléndez i Frigola, Joaquim
López Ibáñez, Beatriz Millán Ruiz, David |
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| 2009 | |
| The paper discusses maintenance challenges of organisations with a huge number of devices and proposes the use of probabilistic models to assist monitoring and maintenance planning. The proposal assumes connectivity of instruments to report relevant features for monitoring. Also, the existence of enough historical registers with diagnosed breakdowns is required to make probabilistic models reliable and useful for predictive maintenance strategies based on them. Regular Markov models based on estimated failure and repair rates are proposed to calculate the availability of the instruments and Dynamic Bayesian Networks are proposed to model cause-effect relationships to trigger predictive maintenance services based on the influence between observed features and previously documented diagnostics | |
| application/pdf | |
| Meléndez, J., López, B., i Millán-Ruiz, D. (2009). Probabilistic models to assist maintenance of multiple instruments. IEEE Conference on Emerging Technologies & Factory Automation : 2009 : ETFA 2009, 1-4. Recuperat 18 juny 2010, a http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5347263 | |
| 978-1-4244-2727-7 | |
| 1946-0759 | |
| http://hdl.handle.net/10256/2668 | |
| eng | |
| IEEE | |
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Reproducció digital del document publicat a: http://dx.doi.org/10.1109/ETFA.2009.5347263 Articles publicats (D-EEEiA) |
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| © IEEE Conference on Emerging Technologies & Factory Automation : 2009 : ETFA 2009, 2009, p. 1-4 | |
| Tots els drets reservats | |
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Control predictiu
Estadística bayesiana Markov, Processos de Medicina -- Aparells i instruments Bayesian statistical decision Markov processes Medical instruments and apparatus Predictive control |
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| Probabilistic models to assist maintenance of multiple instruments | |
| info:eu-repo/semantics/article | |
| DUGiDocs |
