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Torrent Sucarrat, Miquel
Luis Luis, Josep Maria Duran i Portas, Miquel Solà i Puig, Miquel |
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| 2004 | |
| The energy and hardness profile for a series of inter and intramolecular conformational changes at several levels of calculation were computed. The hardness profiles were found to be calculated as the difference between the vertical ionization potential and electron affinity. The hardness profile shows the correct number of stationary points independently of the basis set and methodology used. It was found that the hardness profiles can be used to check the reliability of the energy profiles for those chemical system | |
| application/pdf | |
| Torrent-Sucarrat, M., Luis, J.M., Duran, M., i Solà , M. (2004). The hardness profile as a tool to detect spurious stationary points in the potential energy surface. Journal of Chemical Physics, 120 (23), 10914-10924. Recuperat 8 febrer 2011,a http://link.aip.org/link/JCPSA6/v120/i23/p10914/s1 | |
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0021-9606 (versió paper) 1089-7690 (versió electrònica) |
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| http://hdl.handle.net/10256/3227 | |
| eng | |
| American Institute of Physics | |
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Reproducció digital del document publicat a: http://dx.doi.org/10.1063/1.1742793 Articles publicats (D-Q) |
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| © Journal of Chemical Physics, 2004, vol. 120, núm. 23, p. 10914-10924 | |
| Tots els drets reservats | |
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Enllaços quÃmics
Models matemà tics Polarització (Electricitat) Chemical bonds Mathematical models Polarization (Electricity) |
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| The hardness profile as a tool to detect spurious stationary points in the potential energy surface | |
| info:eu-repo/semantics/article | |
| DUGiDocs |
