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Molecular hydrogen diffusion in nanostructured amorphous silicon thin films

We study hydrogen stability and its evolution during thermal annealing in nanostructured amorphous silicon thin films. From the simultaneous measurement of heat and hydrogen desorption, we obtain the experimental evidence of molecular diffusion in these materials. In addition, we introduce a simple diffusion model which shows good agreement with the experimental data

© Physical Review B, 2009, vol. 80, núm. 7, p. 073202

American Physical Society

Autor: Kail, Fatiha
Farjas Silva, Jordi
Roura Grabulosa, Pere
Data: 2009
Resum: We study hydrogen stability and its evolution during thermal annealing in nanostructured amorphous silicon thin films. From the simultaneous measurement of heat and hydrogen desorption, we obtain the experimental evidence of molecular diffusion in these materials. In addition, we introduce a simple diffusion model which shows good agreement with the experimental data
Format: application/pdf
ISSN: 1098-0121 (versió paper)
1550-235X (versió electrònica)
Accés al document: http://hdl.handle.net/10256/8575
Llenguatge: eng
Editor: American Physical Society
Col·lecció: Reproducció digital del document publicat a: http://dx.doi.org/10.1103/PhysRevB.80.073202
Articles publicats (D-F)
És part de: © Physical Review B, 2009, vol. 80, núm. 7, p. 073202
Drets: Tots els drets reservats
Matèria: Hidrogenació
Hydrogenation
Silici
Silicon
Materials nanoestructurals
Nanostructure materials
Thin films
Capes fines
Títol: Molecular hydrogen diffusion in nanostructured amorphous silicon thin films
Tipus: info:eu-repo/semantics/article
Repositori: DUGiDocs

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