Ítem
| 1 juny 2018 | |
| http://hdl.handle.net/2072/311934 | |
| American Institute of Physics | |
| Tots els drets reservats | |
|
Amorphous semiconductors
Espectroscòpia Raman Hidrogenació Semiconductors amorfs Silici Hydrogenation Raman spectroscopy |
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| Relaxation and derelaxation of pure and hydrogenated amorphous silicon during thermal annealing experiments | |
| info:eu-repo/semantics/article | |
| Recercat |
