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Point sampling with uniformly distributed lines

In this paper we address the problem of extracting representative point samples from polygonal models. The goal of such a sampling algorithm is to find points that are evenly distributed. We propose star-discrepancy as a measure for sampling quality and propose new sampling methods based on global line distributions. We investigate several line generation algorithms including an efficient hardware-based sampling method. Our method contributes to the area of point-based graphics by extracting points that are more evenly distributed than by sampling with current algorithms

IEEE

Author: Rovira, Jordi
Wonka, Peter
Castro Villegas, Francesc
Sbert, Mateu
Abstract: In this paper we address the problem of extracting representative point samples from polygonal models. The goal of such a sampling algorithm is to find points that are evenly distributed. We propose star-discrepancy as a measure for sampling quality and propose new sampling methods based on global line distributions. We investigate several line generation algorithms including an efficient hardware-based sampling method. Our method contributes to the area of point-based graphics by extracting points that are more evenly distributed than by sampling with current algorithms
Document access: http://hdl.handle.net/2072/94971
Language: eng
Publisher: IEEE
Rights: Tots els drets reservats
Subject: Algorismes computacionals
Geometria computacional
Imatgeria tridimensional
PolĂ­gons
Computer algorithms
Computational geometry
Polygons
Three-dimensional imaging
Title: Point sampling with uniformly distributed lines
Type: info:eu-repo/semantics/article
Repository: Recercat

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